Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5355081 | Method for testing a semiconductor integrated circuit having self testing circuit | Yoshiro Nakata, Atsushi Fujiwara | 1994-10-11 |
| 5341035 | Substrate potential generator | Toshio Yamada | 1994-08-23 |