Issued Patents 1994
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5355081 | Method for testing a semiconductor integrated circuit having self testing circuit | Yoshiro Nakata, Akinori Shibayama | 1994-10-11 |
AF
Atsushi Fujiwara
Overall (1994): #155,258 of 165,921Top 95%
1
Patents 1994