Issued Patents 1994
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5350919 | Quantitative analyzing method by a secondary ion mass spectrometric method and a secondary ion mass spectrometer | Takashi Hirano, Hideki Kimura | 1994-09-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5350919 | Quantitative analyzing method by a secondary ion mass spectrometric method and a secondary ion mass spectrometer | Takashi Hirano, Hideki Kimura | 1994-09-27 |