Issued Patents 1994
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5289004 | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light | Takao Okada, Akira Yagi, Yasuhiro Sugawara, Tsugiko Takase | 1994-02-22 |