Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5336887 | Scanning probe microscope | Hirofumi Miyamoto | 1994-08-09 |
| 5289004 | Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light | Takao Okada, Yasuhiro Sugawara, Seizo Morita, Tsugiko Takase | 1994-02-22 |