Issued Patents 1994
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5349587 | Multiple clock rate test apparatus for testing digital systems | Benoit Nadeau-Dostie, Dwayne Burek, Stephen K. Sunter | 1994-09-20 |
AH
Abu Hassan
Overall (1994): #160,525 of 165,921Top 100%
1
Patents 1994