Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5349587 | Multiple clock rate test apparatus for testing digital systems | Abu Hassan, Dwayne Burek, Stephen K. Sunter | 1994-09-20 |
| 5323400 | Scan cell for weighted random pattern generation and method for its operation | Vinod K. Agarwal, Fidel Muradali | 1994-06-21 |