Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5304797 | Gas analyzer for determining impurity concentration of highly-purified gas | Takashi Irie, Keiji Hasumi | 1994-04-19 |
| 5278408 | Instrument and method for 3-dimensional atomic arrangement observation | Hiroshi Kakibayashi, Hideo Todokoro, Katsuhiro Kuroda | 1994-01-11 |