SW

Shinichi Wakana

Fujitsu Limited: 1 patents #527 of 1,880Top 30%
Overall (1994): #67,654 of 165,921Top 45%
1
Patents 1994

Issued Patents 1994

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5331275 Probing device and system for testing an integrated circuit Kazuyuki Ozaki, Yoshiro Goto, Akio Ito, Kazuo Okubo, Soichi Hama +2 more 1994-07-19