Issued Patents 1994
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5331275 | Probing device and system for testing an integrated circuit | Kazuyuki Ozaki, Shinichi Wakana, Yoshiro Goto, Akio Ito, Soichi Hama +2 more | 1994-07-19 |
| 5300880 | Method of measuring a voltage with an electron beam apparatus | Akio Ito, Takayuki Anbe, Hironori Teguri | 1994-04-05 |