SK

Shigeru Kato

NI Nikon: 2 patents #12 of 120Top 10%
Overall (1989): #16,029 of 140,708Top 15%
2
Patents 1989

Issued Patents 1989

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
4890245 Method for measuring temperature of semiconductor substrate and apparatus therefor Masahiko Yomoto, Makoto Uehara, Hajime Ichikawa 1989-12-26
4859832 Light radiation apparatus Makoto Uehara, Hajime Ichikawa, Masahiko Yomoto 1989-08-22