Issued Patents 1989
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4886975 | Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces | Michio Kohno, Akiyoshi Suzuki | 1989-12-12 |
| 4808546 | SOI process for forming a thin film transistor using solid phase epitaxy | Masahiro Moniwa, Masanobu Miyao, Shoji Shukuri, Terunori Warabisako, Masao Tamura +5 more | 1989-02-28 |
| 4795911 | Surface examining apparatus for detecting the presence of foreign particles on the surface | Michio Kohno, Akiyoshi Suzuki | 1989-01-03 |