Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11908657 | Scanning electron microscope device and electron beam inspection apparatus | Qinglang Meng | 2024-02-20 |
| 11908658 | Scanning electron microscope device and electron beam inspection apparatus | Qinglang Meng | 2024-02-20 |
| 11756761 | Wien filter and charged particle beam imaging apparatus | Qinglang Meng, Yan Zhao | 2023-09-12 |
| 11295928 | Multi-pole deflector for charged particle beam and charged particle beam imaging apparatus | Qinglang Meng, Yan Zhao | 2022-04-05 |
| 11239044 | Wien filter and charged particle beam imaging apparatus | Qinglang Meng, Yan Zhao | 2022-02-01 |
| 11084118 | Method and system of all-position plasma welding process for titanium alloy pipeline | Chunlin Dong, Chunfu Guo, Dan Liu, Boyan Liu, Yaoyong Yi +6 more | 2021-08-10 |
| 10347460 | Patterned substrate imaging using multiple electron beams | Yan Zhao, Tao Feng | 2019-07-09 |
| 10134560 | Multi-stage/multi-chamber electron-beam inspection system | Weimin Ma | 2018-11-20 |