Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11908657 | Scanning electron microscope device and electron beam inspection apparatus | Weiqiang Sun | 2024-02-20 |
| 11908658 | Scanning electron microscope device and electron beam inspection apparatus | Weiqiang Sun | 2024-02-20 |
| 11756761 | Wien filter and charged particle beam imaging apparatus | Weiqiang Sun, Yan Zhao | 2023-09-12 |
| 11295928 | Multi-pole deflector for charged particle beam and charged particle beam imaging apparatus | Weiqiang Sun, Yan Zhao | 2022-04-05 |
| 11239044 | Wien filter and charged particle beam imaging apparatus | Weiqiang Sun, Yan Zhao | 2022-02-01 |