Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11636584 | Real-time traceability method of width of defect based on divide-and-conquer | Weimin Lou, Fanyi Wang, Yubin Du, Pan Guo, Shiwei Chen | 2023-04-25 |
| 10444160 | Surface defects evaluation system and method for spherical optical components | Dong Liu, Yang Li, Huiting Chai, Pin Cao, Fan Wu | 2019-10-15 |
| 9062959 | Wavelength scanning interferometer and method for aspheric surface measurement | Kaiwei Wang, Jian Bai, Yibing Shen | 2015-06-23 |