Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11636584 | Real-time traceability method of width of defect based on divide-and-conquer | Yongying Yang, Weimin Lou, Yubin Du, Pan Guo, Shiwei Chen | 2023-04-25 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11636584 | Real-time traceability method of width of defect based on divide-and-conquer | Yongying Yang, Weimin Lou, Yubin Du, Pan Guo, Shiwei Chen | 2023-04-25 |