Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11333614 | Inspection system of semiconductor device and related inspection method | Jin Xing Chen | 2022-05-17 |
| 11112482 | Method for calibrating verticality of particle beam and system applied to semiconductor fabrication process | Jin Xing Chen, Zheng Yi Cai | 2021-09-07 |