Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8224062 | Method and apparatus for inspection of wafer and semiconductor device | Yoshio Fukuda | 2012-07-17 |
| 7830011 | Semiconductor element and wafer level chip size package therefor | Kentaro Nomoto, Yuki Igawa, Hiroshi Saitoh, Takashi Sato, Toshio Ohashi | 2010-11-09 |
| 7642799 | Test chip socket and method for testing a chip | — | 2010-01-05 |
| 7626410 | Apparatus for testing a semiconductor device | — | 2009-12-01 |
| 7388198 | Electron microscope | — | 2008-06-17 |
| 7262512 | Surface mount chip package | — | 2007-08-28 |
| 7230326 | Semiconductor device and wire bonding chip size package therefor | — | 2007-06-12 |
| 6800853 | Electron microscope and method of photographing TEM images | — | 2004-10-05 |
| 6621176 | Input device for use in vehicles for inputting settings pertaining to driver's intention of acceleration and deceleration | Chikao Nagasaka, Hiroshi Tsuge, Toru Nakamura | 2003-09-16 |