Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9037430 | Methods and systems for non-destructively testing a polycrystalline diamond element | Jason K. Wiggins, Kenneth E. Bertagnolli, Gene Bogdanov | 2015-05-19 |
| 8581975 | Infrared defect detection system and method for the evaluation of powdermetallic compacts | Souheil Benzerrouk, Diran Apelian | 2013-11-12 |
| 8274136 | Semiconductor patch antenna | Sergey Makarov, Francesca Scire-Scappuzzo, John McNeill | 2012-09-25 |
| 7828043 | Non-invasive real-time level sensing and feedback system for the precision sand casting process | Brian M. Foley, Scott W. Biederman, Sergey Makarov | 2010-11-09 |
| 7427861 | Dual-tuned microstrip resonator volume coil | Gene Bogdanov, Craig Ferris | 2008-09-23 |
| 7343194 | Method and apparatus for performing neuroimaging | Craig Ferris, Arthur C. Allard, Gene Bogdanov | 2008-03-11 |
| 7202668 | Microstrip coil design for MRI apparatus | Mathew Brevard, Gene Bogdanov | 2007-04-10 |
| 7084630 | Multi-modal RF coil for magnetic resonance imaging | Gene Bogdanov, Aghogho Obi | 2006-08-01 |
| 6873156 | Method and apparatus for performing neuroimaging | Craig Ferris, Jean A King, Arthur C. Allard, Gene Bogdanov | 2005-03-29 |
| 6711430 | Method and apparatus for performing neuroimaging | Craig Ferris, Jean A King, Arthur C. Allard, Gene Bogdanov | 2004-03-23 |
| 6693443 | Systems for detecting and measuring inclusions | Diran Apelian, Sergey Makarov | 2004-02-17 |
| 6590200 | Systems for detecting measuring inclusions | Diran Apelian, Sergey Makarov | 2003-07-08 |
| 6218846 | Multi-probe impedance measurement system and method for detection of flaws in conductive articles | John McNeill, Jennifer A. Stander | 2001-04-17 |
| 4855858 | Power regulator with overcurrent protection | Martin Boertzel, Wilhelm Schmits, Ulrich Weiss | 1989-08-08 |