Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6218846 | Multi-probe impedance measurement system and method for detection of flaws in conductive articles | Reinhold Ludwig, John McNeill | 2001-04-17 |
| 6184806 | Rate 32/33 (D=0, K=6) run length limited modulation code having optimized error propagation | Ara Patapoutian, Peter McEwen, Bahjat Zafer, James Fitzpatrick | 2001-02-06 |