Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7816152 | In situ, ex situ and inline process monitoring, optimization and fabrication | Woo Sik Yoo | 2010-10-19 |
| 7718554 | Focused laser beam processing | Woo Sik Yoo | 2010-05-18 |
| 7599048 | Optical emission spectroscopy process monitoring and material characterization | Woo Sik Yoo | 2009-10-06 |
| 7344979 | High pressure treatment for improved grain growth and void reduction | Woo Sik Yoo | 2008-03-18 |
| 7262918 | Light beam conditioner | Woo Sik Yoo | 2007-08-28 |
| 6636626 | Wafer mapping apparatus and method | Woo Sik Yoo | 2003-10-21 |
| 6621943 | System and method for converting analog data to digital data | Woo Sik Yoo, Taro Yamazaki | 2003-09-16 |
| 6591161 | Method for determining robot alignment | Woo Sik Yoo | 2003-07-08 |
| 6516244 | Wafer alignment system and method | Woo Sik Yoo | 2003-02-04 |