Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387292 | Method and system for correcting phase of image reconstruction signal | Kyungmin Hwang, Ji Won Kim | 2025-08-12 |
| 11734807 | Method and system for correcting phase of image reconstruction signal | Kyungmin Hwang, Ji Won Kim | 2023-08-22 |
| 11270418 | Method and system for correcting phase of image reconstruction signal | Kyungmin Hwang, Ji Won Kim | 2022-03-08 |
| 9733196 | Upper surface foreign material detecting device of ultra-thin transparent substrate | Hyung Seok Lee, Cheul Ock Chae, Jin Yong Kim, Soung Jin Kim | 2017-08-15 |
| 9316598 | Method of detecting foreign material on upper surface of transparent substrate using polarized light | Cheul Ock Chae, Jin Yong Kim, Sang Tae Kim | 2016-04-19 |
| 7286242 | Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same | Ji Jong Park, Jin Yong Kim, Joong Whan Lee | 2007-10-23 |