Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7286242 | Apparatus for measuring characteristics of thin film by means of two-dimensional detector and method of measuring the same | Yeong Ryeol Kim, Jin Yong Kim, Joong Whan Lee | 2007-10-23 |