Issued Patents All Time
Showing 51–52 of 52 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8415947 | Method for stress assessment that removes temperature effects and hysteresis on the material property measurements | Yanko K. Sheiretov, Neil J. Goldfine, Todd M Dunford, David C. Grundy, Darrell E. Schlicker +2 more | 2013-04-09 |
| 8222897 | Test circuit with sense elements having associated and unassociated primary windings | Yanko K. Sheiretov, Neil J. Goldfine, Todd M Dunford, David C. Grundy, Darrell E. Schlicker +2 more | 2012-07-17 |