Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5477548 | Method for testing an integrated circuit means having a hierarchical organization of at least three levels, and integrated circuit means and integrated circuit suitable for being so tested | Franciscus P. M. Beenker, Rudi J. J. Stans, Max van der Star | 1995-12-19 |
| 5428625 | Method of controlling a self-test in a data processing system and data processing system suitable for this method | — | 1995-06-27 |
| 5325367 | Memory device containing a static ram memory that is adapted for executing a self-test, and integrated circuit containing such a device as an embedded static ram memory | Aloysius P. Thijssen, Franciscus P. M. Beenker, Joris Jansen | 1994-06-28 |