Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5477548 | Method for testing an integrated circuit means having a hierarchical organization of at least three levels, and integrated circuit means and integrated circuit suitable for being so tested | Franciscus P. M. Beenker, Robertus W. C. Dekker, Rudi J. J. Stans | 1995-12-19 |
| 5008618 | Scan test apparatus for asynchronous circuitry | — | 1991-04-16 |