ZL

Zvi Landau

UT Upa Technology: 1 patents #4 of 13Top 35%
📍 Elmont, NY: #422 of 894 inventorsTop 50%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,936,080 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4860329 X-ray fluorescence thickness measuring device Murray Weiser, William Silverman, Paul Finer, Cary Pincus 1989-08-22