Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4860329 | X-ray fluorescence thickness measuring device | Murray Weiser, William Silverman, Zvi Landau, Cary Pincus | 1989-08-22 |
| 4646341 | Calibration standard for X-ray fluorescence thickness | Robert O. Wahl, William Silverman | 1987-02-24 |