Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933747 | System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects | Huapeng Huang, Lester W. Schultheis | 2024-03-19 |