Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933747 | System and method for in-situ X-ray diffraction-based real-time monitoring of microstructure properties of printing objects | Peter Zavalij, Lester W. Schultheis | 2024-03-19 |
| 8647705 | Methods for forming superconductor articles and XRD methods for characterizing same | Jodi Lynn Reeves, David M. Gibson, Walter M. Gibson | 2014-02-11 |
| 8130908 | X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic | Alexei Vershinin | 2012-03-06 |
| 7711088 | Method and system for X-ray diffraction measurements using an aligned source and detector rotating around a sample surface | David M. Gibson, Walter M. Gibson, Jodi Lynn Reeves | 2010-05-04 |
| 7236566 | In-situ X-ray diffraction system using sources and detectors at fixed angular positions | David M. Gibson, Walter M. Gibson | 2007-06-26 |