Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6133055 | Method of forming a test key architecture | — | 2000-10-17 |
| 6060900 | Method for measuring current density in a semiconductor device with kink effect | — | 2000-05-09 |
| 6046601 | Method for measuring the kink effect of a semiconductor device | Yang-Hui Fang | 2000-04-04 |
| 5949240 | Test connecting device including testkey and probe card for use in the testing of integrated circuits | — | 1999-09-07 |