Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11644427 | Automatic detection method and automatic detection system for detecting crack on wafer edges | Chia-Feng Hsiao, Chung-Hsuan Wu, Shuo-Yu Chen, Nai-Ying Lo, Yi-Hui Tseng +2 more | 2023-05-09 |
| 11151724 | Automatic detecting method and automatic detecting apparatus using the same | Ching-Hsing Hsieh, Chia-Chi Chang, Ju-Te Chen, Chen-Hui Huang, Cheng-Hsien Chen | 2021-10-19 |