Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11614486 | Testkey and testing system which reduce leakage current | Chang-Ting Lo | 2023-03-28 |
| 9939463 | Test circuit for testing a device-under-test by using a voltage-setting unit to pull an end of the device-under-test to a predetermined voltage | — | 2018-04-10 |