Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11614486 | Testkey and testing system which reduce leakage current | Po-Wei Tsou | 2023-03-28 |
| 10762951 | Static random access memory device with keeper circuit | Chih-Wei Tsai, Tsan-Tang Chen, Chung-Cheng Tsai, Yen-Hsueh Huang, Chun-Yen Tseng +1 more | 2020-09-01 |