Issued Patents All Time
Showing 26–28 of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8228058 | Eddy current flaw detection probe | Akira Nishimizu, Hirofumi Ouchi, Yoshio Nonaka, Yosuke Takatori, Akihiro Taki | 2012-07-24 |
| 7593266 | Semiconductor memory device and method of verifying the same | Kazunari Kido, Shunichi Toyama, Yoshihiro Tsukidate | 2009-09-22 |
| 6957583 | Ultrasonic array sensor, ultrasonic inspection instrument and ultrasonic inspection method | Masahiro Tooma, Naoyuki Kono, Masahiro Koike, Hirokazu Adachi, Takao Shimura +1 more | 2005-10-25 |