Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7323879 | Method and circuit for measuring capacitance and capacitance mismatch | Shu-Hua Kuo | 2008-01-29 |
| 7246019 | Method and apparatus for measuring delay time | Shu-Hua Kuo, Yanan Mou, Jiunn-Fu Liu | 2007-07-17 |