| 12218180 |
Multi-layered resistor with a tight temperature coefficient of resistance tolerance |
Szu-Hsien Lo, Tzu-Chung Tsai |
2025-02-04 |
| 12091752 |
Apparatus and method of manufacturing interconnect structures |
Yu-Ting Tsai, Chung-Liang Cheng, Wen-Cheng Cheng, Yu-Cheng Shen, Chyi-Tsong Ni |
2024-09-17 |
| 11923403 |
Multi-layered resistor with a tight temperature coefficient of resistance tolerance |
Szu-Hsien Lo, Tzu-Chung Tsai |
2024-03-05 |
| 9689935 |
Hall-effect measurement apparatus |
Ming-Cheng Lin |
2017-06-27 |
| 8415723 |
Spacer structure wherein carbon-containing oxide film formed within |
Po-Lun Cheng |
2013-04-09 |
| 8288802 |
Spacer structure wherein carbon-containing oxynitride film formed within |
Po-Lun Cheng |
2012-10-16 |
| 7592231 |
MOS transistor and fabrication thereof |
Po-Lun Cheng |
2009-09-22 |
| 7402496 |
Complementary metal-oxide-semiconductor device and fabricating method thereof |
Po-Lun Cheng, Chun-An Lin, Li-Yuen Tang, Hung-Lin Shih, Ming-Chi Fan +2 more |
2008-07-22 |
| 7329591 |
Method for forming silicon-containing film and method for decreasing number of particles |
Po-Lun Cheng, Hwei-Lin Chuang, Chun-An Lin |
2008-02-12 |