Issued Patents All Time
Showing 51–56 of 56 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6697514 | Apparatus for inspecting a fluorescent substance on a plasma display | Akira Kobayashi, Masatoshi Nakamura, Ryoichi Inoue | 2004-02-24 |
| 6256066 | High-resolution image pickup method and apparatus therefor | Noriaki Yukawa, Hideshi Ueda, Ken Shimono | 2001-07-03 |
| 6171403 | Cleaning and drying apparatus, wafer processing system and wafer processing method | Yuji Kamikawa, Osamu Kuroda, Kenji Soejima | 2001-01-09 |
| 6068002 | Cleaning and drying apparatus, wafer processing system and wafer processing method | Yuji Kamikawa, Osamu Kuroda, Kenji Soejima | 2000-05-30 |
| 5781269 | Distance measuring method and distance sensor | Masami Ito, Kanji Nishii, Seiji Hamano | 1998-07-14 |
| 5668894 | Method for processing three-dimensional shape data | Seiji Hamano, Takashi Ichiyanagi, Kouhei Hamamura | 1997-09-16 |