Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11009797 | Defect inspection apparatus, defect inspection method, and recording medium | — | 2021-05-18 |
| 10677743 | Inspection apparatus and inspection method | Keitarou Suzuki, Osamu Nagano | 2020-06-09 |