Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5966625 | Method for making a slant-surface silicon wafer having a reconstructed atomic-level stepped surface structure | Lei Zhong, Norihiro Shimoi | 1999-10-12 |
| 5047713 | Method and apparatus for measuring a deep impurity level of a semiconductor crystal | Tateo Kusama | 1991-09-10 |