Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5451886 | Method of evaluating lifetime of semiconductor material and apparatus for the same | Yoichiro Ogita | 1995-09-19 |
| 5138255 | Method and apparatus for measuring lifetime of semiconductor material including waveguide tuning means | Kinio Iba | 1992-08-11 |
| 5081414 | Method for measuring lifetime of semiconductor material and apparatus therefor | Kunio Iba | 1992-01-14 |
| 5047713 | Method and apparatus for measuring a deep impurity level of a semiconductor crystal | Yoshio Kirino | 1991-09-10 |