Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9863897 | X-ray nondestructive testing device | Toshihiko Nishizaki, Masahiro Inoue, Masuo Amma, Masaru Nakamura | 2018-01-09 |
| 8378269 | Wafer thermometer, temperature measuring device, heat treatment device and method for measuring temperature of heat treatment unit | Toshiyuki Matsumoto | 2013-02-19 |