Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7417445 | Probing method and prober for measuring electrical characteristics of circuit devices | Takashi Watanabe | 2008-08-26 |
| 6906542 | Probing method and prober | Takashi Watanabe | 2005-06-14 |
| 5034684 | Probe device and method of controlling the same | Kazuo Mitsui, Hiroshi Suzuki, Toshihiro Hosoda, Toshihiko Iijima, Shinji Niwa +2 more | 1991-07-23 |