Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5745500 | Built-in self testing for the identification of faulty integrated circuit chips in a multichip module | Thyagaraju Damarla, Wei Su, Gerald T. Michael | 1998-04-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5745500 | Built-in self testing for the identification of faulty integrated circuit chips in a multichip module | Thyagaraju Damarla, Wei Su, Gerald T. Michael | 1998-04-28 |