Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6332032 | Method for generating test files from scanned test vector pattern drawings | Wei Su, Michael A. Dukes | 2001-12-18 |
| 6314194 | Method for generating computer aided design programming circuit designs from scanned images of the design | Wei Su, Michael A. Dukes | 2001-11-06 |
| 5946415 | Method and apparatus to process drawing images | Wei Su | 1999-08-31 |
| 5781791 | Digital microelectronic circuit package using buffer dies and programmable device or memory dies | Michael A. Dukes, Kenneth J. Keyes | 1998-07-14 |
| 5745500 | Built-in self testing for the identification of faulty integrated circuit chips in a multichip module | Thyagaraju Damarla, Moon Jae CHUNG, Wei Su | 1998-04-28 |
| 5570035 | Built-in self test indicator for an integrated circuit package | Michael A. Dukes | 1996-10-29 |