OK

Oded Kafri

TC The State Of Israel, Atomic Energy Commission: 4 patents #1 of 20Top 5%
RO Rotlex Optics: 3 patents #1 of 5Top 20%
AC Allied Consulting: 1 patents #540 of 1,310Top 45%
TI The State Of Israel: 1 patents #1 of 16Top 7%
Overall (All Time): #226,077 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
6754316 Method and apparatus for registering unanswered telephone calls 2004-06-22
6137424 Passive road sensor for automatic monitoring and method thereof Simon S. Cohen 2000-10-24
6075466 Passive road sensor for automatic monitoring and method thereof Simon S. Cohen 2000-06-13
5801848 Process for transmitting and/or storing information 1998-09-01
5751814 File encryption method 1998-05-12
5313564 Graphic matter and process and apparatus for producing, transmitting and reading the same Marco Luzzatto, Kfir Luzzatto 1994-05-17
5299024 Method and apparatus for broadcasting and receiving broadcasted information 1994-03-29
5191603 Message receiving apparatus 1993-03-02
4854708 Optical examination apparatus particularly useful as a Fizeau interferometer and schlieren device Kathi Kreske 1989-08-08
4810895 Method and apparatus for optical examination of an object particularly by moire ray deflection mapping Ilana Glatt 1989-03-07
4776013 Method and apparatus of encryption of optical images Eliezer Keren 1988-10-04
4722605 Method and apparatus for optically measuring distance between two surfaces Aminadav Livnat 1988-02-02
4639132 Direct determination of modulation transfer function by moire deflectrometry Ilana Glatt, Aminadav Livnat 1987-01-27
4614039 Night sight with light diffraction pattern Aminadav Livnat 1986-09-30
4600304 Optical level Aminadav Livnat 1986-07-15
4590681 Level based on moire effect with ambient light Aminadav Livnat, Eliezer Keren 1986-05-27
4577940 Moire microscope Jerzy S. Krasinski, Donald F. Heller 1986-03-25
4569590 Method and apparatus for measuring the index of refraction of fluids Ziv Karny, Eliezer Keren 1986-02-11
4553839 Frequency marking systems Ziv Karny, Dan MEYERSTEIN 1985-11-19
4459027 Method and equipment for mapping radiation deflection Aminadav Livnat 1984-07-10