Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5355210 | Method and apparatus for measuring optical properties of optical devices | Eliezer Keren, Ami Livnat | 1994-10-11 |
| 4854708 | Optical examination apparatus particularly useful as a Fizeau interferometer and schlieren device | Oded Kafri | 1989-08-08 |