Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11680903 | Systems and methods for three-dimensional fluorescence polarization via multiview imaging | Hari Shroff, Abhishek Kumar, Shalin B. Mehta, Patrick La Riviere, Yicong Wu +1 more | 2023-06-20 |
| 11428632 | Systems and methods for three-dimensional fluorescence polarization via multiview imaging | Hari Shroff, Abhishek Kumar, Shalin B. Mehta, Patrick Jean-La Riviere, Yicong Wu +1 more | 2022-08-30 |
| 7372567 | Retardance measurement system and method | Mykhailo Shribak | 2008-05-13 |
| 7239388 | Retardance measurement system and method | Mykhailo Shribak | 2007-07-03 |
| 7202950 | Retardance measurement system and method | Mykhailo Shribak | 2007-04-10 |
| 7079247 | Instantaneous polarization measurement system and method | Mykhailo Shribak, Paul J. Cronin, Clifford C. Hoyt, Peter J. Miller | 2006-07-18 |
| 6924893 | Enhancing polarized light microscopy | Mykhailo Shribak, Clifford C. Hoyt, Peter Z. Torok | 2005-08-02 |
| 6501548 | Retardance measurement method | — | 2002-12-31 |
| 5521705 | Polarized light microscopy | Guang Mei | 1996-05-28 |