Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7564618 | Orientation independent differential interference contrast microscopy technique and device | — | 2009-07-21 |
| 7372567 | Retardance measurement system and method | Rudolf Oldenbourg | 2008-05-13 |
| 7239388 | Retardance measurement system and method | Rudolf Oldenbourg | 2007-07-03 |
| 7233434 | Orientation independent differential interference contrast microscopy technique and device | — | 2007-06-19 |
| 7202950 | Retardance measurement system and method | Rudolf Oldenbourg | 2007-04-10 |
| 7079247 | Instantaneous polarization measurement system and method | Rudolf Oldenbourg, Paul J. Cronin, Clifford C. Hoyt, Peter J. Miller | 2006-07-18 |
| 6924893 | Enhancing polarized light microscopy | Rudolf Oldenbourg, Clifford C. Hoyt, Peter Z. Torok | 2005-08-02 |