Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8644574 | Measurement of thin-layered structures in X-ray computer tomography | Raul San Jose Estepar, George R. Washko, JR., John J. Reilly, Ron Kikinis, Carl-Fredrik Westin | 2014-02-04 |